IEC 60065 2014 Test Probe For Verify The Protection Against Access With A Finger

IEC 60065:2014 clause 9.1.1.3Test probe B

Standard

Conforms to IEC 60065:2014 clause 9.1.1.3, 13.4, IEC 61032 test probe B, figure 2, IEC60950 figure 2A, IEC60884, IEC60335, UL507, and UL1278 figure 8.4.

Application:

This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.

Test sample:

Easily accessible enclosure live parts or mechanical parts.

Feature:

This test finger probe consists of dito, finger, base and insulated handle which simulates the characteristics of the human hand. It has two movable joints, which can be curved at 90°. Customizable: it can be used for anti-electric shock test when equipped with pluggable banana plugs and amphenol connector at the end of the handle , or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).

Parameters(mm):

Model	HT-I02	HT-I02A	HT-I02B	HT-I02T
Name	Standard Test Finger	Circular Baffle Test finger	Large Baffle Test Finger	Standard Test Finger With Force
Joint 1	30±0.2	30±0.2	30±0.2	30±0.2
Joint 2	60±0.2	60±0.2	60±0.2	60±0.2
Finger length	80±0.2	80±0.2	100±0.2	80±0.2
Fingertip to baffle	180±0.2	180±0.2	----	180±0.2
Cylindrical	R2±0.05	R2±0.05	R2±0.05	R2±0.05
Spherical	R4±0.05	R4±0.05	R4±0.05	R4±0.05
Fingertip cutting bevel angle	37^o 0 -10′	37^o 0 -10′	37^o 0 -10′	37^o 0 -10′
Fingertip taper	14^o 0 -10′	14^o 0 -10′	14^o 0 -10′	14^o 0 -10′
Test finger diameter	Ф12 0 -0.05	Ф12 0 -0.05	Ф12 0 -0.05	Ф12 0 -0.05
A-A Section diameter	Ф50	Ф50	----	Ф50
A-A Section width	20±0.2	----	----	20±0.2
Baffle diameter	Ф75±0.2	Ф75±0.2	Ф125±0.2	Ф75±0.2
Baffle thickness	5±0.5	5±0.5	----	5±0.5
Force	----	----	----	With force of 10N, 20N,30N
Applied standard	IEC61032-1	IEC60335-1	IEC60335-2-14	IEC60529-1

Picture for reference: