IEC 60065 2014 Test Probe For Verify The Protection Against Access With A Finger

IEC 60065 2014 Test Probe For Verify The Protection Against Access With A Finger

  • Model:

       IEC 60065:2014 clause probe B



Conforms to IEC 60065:2014 clause, 13.4, IEC 61032 test probe B, figure 2, IEC60950 figure 2A, IEC60884, IEC60335, UL507, and UL1278 figure 8.4.



This probe is intended to verify the basic protection against access to hazardous parts. It is also used to verify the protection against access with a finger.


Test sample:

Easily accessible enclosure live parts or mechanical parts.



This test finger probe consists of dito, finger, base and insulated handle which simulates the characteristics of the human hand. It has two movable joints, which can be curved at 90°. Customizable: it can be used for anti-electric shock test when equipped with pluggable banana plugs and amphenol connector at the end of the handle , or used for enclosure protection test when open threaded hole of M6 at the end of the handle (connected with pull and push dynamometer).




NameStandard Test FingerCircular Baffle Test fingerLarge Baffle Test FingerStandard Test Finger With Force
Joint 130±0.230±0.230±0.230±0.2
Joint 260±0.260±0.260±0.260±0.2
Finger length80±0.280±0.2100±0.280±0.2
Fingertip to baffle180±0.2180±0.2----180±0.2
Fingertip cutting bevel angle37o 0 -10′37o 0 -10′37o 0 -10′37o 0 -10′
Fingertip taper14 o 0 -10′14 o 0 -10′14 o 0 -10′14 o 0 -10′
Test finger diameterФ12 0 -0.05Ф12 0 -0.05Ф12 0 -0.05Ф12 0 -0.05
A-A Section diameterФ50Ф50----Ф50
A-A Section width20±0.2--------20±0.2
Baffle diameterФ75±0.2Ф75±0.2Ф125±0.2Ф75±0.2
Baffle thickness5±0.55±0.5----5±0.5
Force------------With force of 10N, 20N,30N
Applied standardIEC61032-1IEC60335-1IEC60335-2-14IEC60529-1


Picture for reference